No. 1387
	Electrostatic discharge as a failure source
	Investigating R&D Committee on the electrostatic discharge as a failure source
	Keyword : Electrostatic discharge, Micro gap, Surface charging, Trouble case
	This committee was organized under the chair of Tetsuji Oda (The University of Tokyo) to investigate and disseminate accurate knowledge on the electrostatic discharge phenomenon as a threat to electromagnetic compatibility. In the committee meetings, we focused not only on the electrostatic charge accumulation/discharge phenomena, but also on many practical issues caused by such electrostatic discharge. In this technical report, recent studies on discharge characteristics across micrometer-scale gap, electrostatic charge accumulation phenomena on insulator surface and subsequent electrostatic discharge phenomena are investigated. In addition, the electrostatic hazards and their handling methods to HDD, a magnetic tape, and circuit boards are also surveyed.
	©2007. The Institute of Electrical Engineers of Japan