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Inverse scattering analysis determining the position, size, shape, and electrical properties of unknown objects by measuring scattered waves for a given incident wave has great potential applications in many fields such as medical imaging, geophysical exploration, and nondestructive testing. Since various methods that are applicable to high-contrast inverse scattering problems have been developed in the last two decades, the inverse scattering analysis is becoming more important and useful. However, despite the importance of the inverse scattering analysis, there are not many Japanese researchers in this field. Considering this situation, we planned this review report to be an introductory guide to inverse scattering analysis for Japanese students, researchers, and engineers who are interested in this field. Chapter 1 describes a background and recent trends in inverse scattering analysis. The properties of inverse problems, which is quite different from those of direct problems, are discussed in Chapter 2. There are two different approaches to solve inverse scattering problems. One is a frequency domain approach that uses continuous sinusoidal waves as incident waves, and the other is a time domain approach that uses pulsed waves. The frequency domain approaches are described in Chapters 3-6 and 9, and the time domain approaches are in Chapters 8 and 10. In addition, a combination technique of frequency and time domain approaches is also described in Chapter 7. |
